2 article(s) from Ulysse, Christian
A multi-resistance wide-range calibration sample for conductive probe atomic force microscopy measurements
- François Piquemal,
- Khaled Kaja,
- Pascal Chrétien,
- José Morán-Meza,
- Frédéric Houzé,
- Christian Ulysse and
- Abdelmounaim Harouri
Beilstein J. Nanotechnol. 2023, 14, 1141–1148, doi:10.3762/bjnano.14.94
Development of a new hybrid approach combining AFM and SEM for the nanoparticle dimensional metrology
- Loïc Crouzier,
- Alexandra Delvallée,
- Sébastien Ducourtieux,
- Laurent Devoille,
- Guillaume Noircler,
- Christian Ulysse,
- Olivier Taché,
- Elodie Barruet,
- Christophe Tromas and
- Nicolas Feltin
Beilstein J. Nanotechnol. 2019, 10, 1523–1536, doi:10.3762/bjnano.10.150
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